Scanning electron microscopes (SEM) for high-resolution imaging and microstructural characterization of materials.

Ultra high resolution surface imaging and elemental microanalysis for materials science, geology, semiconductors and failure investigation.
Fast, accurate elemental composition for bulk and process materials.
Handheld and benchtop XRF for rapid elemental screening.
Mineralogical and crystalline phase identification.
AAS, ICP-OES, ICP-MS, FTNIR, UV/Vis, AOX, and CNSX systems.